Lim HeeYeon
ssmp7203@gmail.com
https://heyhy823.github.io/
Education
2015/03 – 2019/02 B.S., Applied Statistics
Konkuk University, Seoul (GPA: 4.16 / 4.5)
2015/03 – 2019/02 B.S., Computer Science Engineering
Konkuk University, Seoul (GPA: 3.97 / 4.5)
Research Interests
- Optimization Algorithms & Data-Driven System Development
- Design of optimization frameworks for semiconductor validation tests.
- Devlopment of automated data analysis pipelines to enhance efficiency of hardware evaluation.
- Semiconductor Domain-Specific Data Analytics
- Analysis of semiconductor performance metrics using advanced statistical methods, including regression analysis and two-sample t-tests.
- Application of machine learning and statistical insights to optimize semiconductor manufacturing processes.
- Statistical Modeling & Reliability Analysis
- Application of statistical methods to identify key factors affecting semiconductor reliability.
- Development of performance prediction model to minimize variation and defect rate.
Professional Experience
2021/02 – Present Flash I/O Characteristic Enhancement & E-Fuse Optimization Frameworks Development
- Designed E-Fuse optimization system to enhance Flash I/O characteristics, including signal-integrity, power-integrity, and speed.
- Designed an automated measurement pipeline system for test equipment.
- Designed domain-specific optimization algorithm to imporve product performance and efficiency.
- Built data pipeline systems for efficient evaluation data management and in-depth analysis.
2023/06 – 2025/01 DRAM I/O Characteristics Optimization Algorithm Design Considering Board Variations
- Designed a Test Mode Register Set(TMRS[1]) optimization algorithm using circuit simulation methodologies to improve DRAM I/O characteristics(timing and voltage).
- Designed an automated measurement system for test equipment to enhance reliability and efficiency.
- Designed an optimization system for BIOS(DDR5 Booting Firmware) configurations to streamline evaluation, significantly reduce evalutaion turn-around time.
2022/10 – 2025/01 DRAM Production Validation Algorithm Design and Analysis System Development for Intel
- Designed validation algorithms through reverse engineering.
- Designed a prediction model for validation defect rates and developed a system for upper-bound/lower-bound scenario analysis to estimate performance limits.
- Developed a pre-processing system for package performance analysis and designed data pipelines to enhance efficiency.
2020/02 – 2021/02 Flash Core E-Fuse Optimization System Development
- Designed a genetic Algorithm to optimize Flash E-Fuse, ensuring compliance with performance, variation, and reliability specifications.
- Developend a Real-time raw data pre-processing system.
- Statistical insights and semiconductor design domain knowledge utilization to resolve product issues.
- Developed a data processing pipeline.
Patent
2023.03 [Method for quantifying contribution of trimming parameter and generating post-silicon validation tests], No. US18/506435, A2, 2023-11-10, US
Skill
2024.11 OPIC IH (English Speaking Test)
2020.02 SW(Software) Certification: Samsung SW Professional grade
Award & Honors
2024.06 DRAM Development Division - Q2 Regular Award(Collaboration/Synergy Category)
- Developed a statistics-based sequential logic tool for optimizing Rank Margin Test (RMT[2]) characteristics
2022.08 Memory 3.0 Excellence Award
- Automated Server/Client BIOS TMRS[1] settings for DDR5 RMT[2] measurements.
2022.06 Q2 Design Platform Division Quarterly Award
- Collaborated on product performance and variation by developing specialized applications.
Programming skills
C/C++, Git, Python, Pytorch
[1] Test Mode Register Set, A command used to configure various operating parameters of the DDR memory module. TMRS stores settings that regulate memory functionality, including the timing, burst length, and operational modes.
[2] Rank Margin Test, An automated memory margin test used to identify DDR margins at the Data Queue level. It enables precise margining of DDR Vref & Timing parameters at the CPU & DIMMs by applying stress patterns with results output to the serial port.